About the facility
Our Leeds Electron Microscopy and Spectroscopy (LEMAS) Facility is internationally renowned for microscopic and spectroscopic materials characterisation.
The facility hosts a suite of electron microscopes for examining the morphology, structure and chemical composition of hard and soft materials, from atomic to microstructural length scales.
Drawing on a wealth of experience, our highly trained staff can advise on the most appropriate microscopy techniques in our portfolio and deliver key insights on any sample, from nanoparticles, semiconductors and coatings, to composites, biomaterials and soft matter.
This facility is part of the Henry Royce Institute and is funded by the Engineering and Physical Sciences Research Council.
Funding and access options
If you’re from another academic institution, a research technology organisation, or a UK-based SME, you may be able to access the Leeds Electron Microscopy Facility through Royce’s equipment access schemes.
If you’re a researcher based at the University of Leeds, enquire to explore access options. If you’re a business, learn more about access options for our facilities.
Available equipment
- FEI Titan3 Themis 300 kV scanning transmission electron microscope (S/TEM), energy-dispersive spectroscopy (EDS), Gatan Quantum ER electron energy loss spectroscopy (EELS), energy-filtered transmission electron microscopy (EFTEM) and OneView camera. In-situ holders for heating, cooling, liquid environments and tomography. Atomic resolution imaging and elemental mapping.
- Tescan Tensor, the world's first integrated precession-assisted 100 kV analytical 4D-STEM with bright field (BF), annular dark-field (ADF), high angle annular dark-field (HAADF), Dectris Quadro integrated direct electron detector and EDS. Offering imaging, virtual STEM composition, orientation, phase and strain mapping and tomography.
- FEI Helios G4 CX Dual Beam FEGSEM/Ga Focused Ion Beam (FIB) with Oxford AZtec Energy energy-dispersive x-ray spectroscopy (EDX) system. Quorum PP3010T Cryo SEM capabilities. In-situ transmission electron microscopy (TEM) sample preparation and slice and view acquisition of multi-signal 3D datasets.
- Tescan AmberX Plasma FIBSEM Plasma focused ion beam and field-free ultra-high resolution field emission gun scanning electron microscope (UHR FEG SEM) for multiscale materials characterisation with Oxford AZtec Energy EDX system and electron backscatter diffraction (EBSD), integrated time of flight secondary ion mass spectrometer (ToF-SIMS) and Quorum PP3010T Cryo SEM capabilities. 3D large volume microscopy.
- Hitachi SU8230 ultra-high resolution scanning electron microscope (SEM) with Oxford Instruments AZtec Energy EDX system, low kV, simultaneous scanning electron (SE), backscattered electron (BSE), BF and dark-field (DF) imaging at nanoscale resolution.
- Hitachi SU3900 VP-SEM with Oxford Instruments AZtec live with dual Ultim65 EDX detectors, SE and BSE imaging, EDX elemental mapping.
- FEI Quanta 650 FEGESEM environmental SEM with Oxford Instruments AZtec EDX system, EBSD and cathodoluminescence (CL). SEM for orientation, imaging, texture analysis with environmental capabilities.
- Jeol JXA 8230 dedicated electron microprobe with five spectrometers, EDX capabilities for quantitative mapping and microanalysis.
- Tescan VEGA3 XM W SEM with large chamber and high sample throughput, equipped with RGB filtered CL system, AZtec EDX system with X-max 150 SDD and Feature software for automated particle analysis.
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